Physics of Semiconductor Devices

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One goal of the Physics of Semiconductor Devices project is to measure captured carriers within the band-gap of a semiconductor. If a carrier (a hole or electron) is captured and then released in the band, the capture center is called a trap. These traps arise from defects or impurities in the material. One technique for measuring these traps is through Deep Level Transient Spectroscopy, or DLTS. This technique essentially measures the change in capacitance of the semiconductor.


Background